The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Jan. 26, 2007
Applicants:

Hiromi Onomichi, Kobe, JP;

Masakazu Fukuda, Hyogo, JP;

Inventors:

Hiromi Onomichi, Kobe, JP;

Masakazu Fukuda, Hyogo, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzer that comprises a sample measuring mechanism for measuring a sample and generating a measurement value, a memory for storing a plurality of standard values for evaluation of the measurement value, the plurality of standard values including a fixed standard value and a variable standard value, a controller for evaluating the measurement value based on the standard values; and an output device for outputting result of the evaluation of the measurement value by the evaluation means is disclosed. A computer program product is also disclosed.


Find Patent Forward Citations

Loading…