The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

Jun. 30, 2004
Applicants:

Patrick D. Kinney, Hayward, CA (US);

Howard G. King, Berkeley, CA (US);

Michael C. Pallas, San Bruno, CA (US);

Mark Naley, Santa Clara, CA (US);

Inventors:

Patrick D. Kinney, Hayward, CA (US);

Howard G. King, Berkeley, CA (US);

Michael C. Pallas, San Bruno, CA (US);

Mark Naley, Santa Clara, CA (US);

Assignee:

Applera Corporation, Foster City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, software, and apparatus for focusing an image in biological instrument are disclosed. Focusing elements are moved to various focus positions within a focus element travel range, and sample images are captured at the various focus positions. The sample images are resolved into subregions and an optimal focus position is determined based on the image intensity statistical dispersions within the identified subregions.


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