The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Apr. 26, 2004
Roland Proksa, Hamburg, DE;
Thomas Köhler, Norderstedt, DE;
Roland Proksa, Hamburg, DE;
Thomas Köhler, Norderstedt, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An iterative method determines a spatial distribution of values of a property of an object, and particularly values of its absorption, in an examination region, on the basis of measured values that values are acquired with a measuring device, and particularly with a computer tomograph. The reliability of each measured value is taken into account when this is done. The measured values can each be represented as a sum of values of the property that have each been multiplied by a proportional factor, the proportional factor being a measure of the proportion that a value of the property forms of the measured value. Each value of the property is approached by one iteration value at a time by setting each iteration value to a starting value and, in an iteration step, generating for each measured value a reference measured value, forming the difference between each reference measured value and the corresponding measured value, and multiplying this difference by a reliability parameter and projecting it backward into the examination region.