The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Feb. 11, 2005
Gary A. Carr, Fairfax, VA (US);
Christian Diaz, Falls Church, VA (US);
Arthur Lee Clouse, Washington, DC (US);
Gary A. Carr, Fairfax, VA (US);
Christian Diaz, Falls Church, VA (US);
Arthur Lee Clouse, Washington, DC (US);
Ensco, Inc., Springfield, VA (US);
Abstract
An integrated measurement device for taking gauge and cross-level measurements between two objects. The integrated measurement device includes at least an emitter/receiver unit, a sensor unit, and a microprocessor. In operation, the integrated measurement device is pivotably placed on the top of the first object such that a light emitted from the emitter/receiver unit travels along a surface of the second object as the device rotates about a pivot point of the first object. The sensor unit senses data associated with incident angles and traveling distances of the emitted light. Based on the data sensed by the sensor unit, the microprocessor calculates the incident angle, the traveling distance, and a distance between the first and second objects. The calculated values can also be transformed to (x, y) space coordinates that are used to describe a profile of the second object.