The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

May. 22, 2006
Applicants:

Andrei B. Vakhtin, Los Alamos, NM (US);

Daniel J. Kane, Santa Fe, NM (US);

Kristen A. Peterson, Santa Fe, NM (US);

Inventors:

Andrei B. Vakhtin, Los Alamos, NM (US);

Daniel J. Kane, Santa Fe, NM (US);

Kristen A. Peterson, Santa Fe, NM (US);

Assignee:

Southwest Sciences Incorporated, Santa Fe, NM (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real-valued interferograms to obtain the complex spectral interferogram.


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