The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Mar. 27, 2006
Yosuke Iwata, Kyoto, JP;
Motoaki Mori, Tokyo, JP;
Naoki Asakawa, Tokyo, JP;
Shimadzu Corporation, Kyoto-shi, JP;
Eisai R&D Management Co., Ltd., Tokyo, JP;
Abstract
An elution test method measures the elution process of a specific component in a process where a preparation containing at least the specific component subject to a change with time in chemical properties after elution and an impurity component not subject to a change with time in chemical properties after elution is eluted into a test liquid. The method obtains a ratio of absorbance k of the impurity component and a ratio of absorbance k' of the specific component at two isosbestic point wavelengths λin a spectrum including the specific component and its decomposed matter, and calculates at least one of the absorbances A(t), A(t) of said specific component by using k×C(t)−C(t)=k×A(t)−A(t) and A(t)/A(t)=k′ from the absorbance C(t), C(t) at said two isosbestic point wavelengths λmeasured at the plural time points t in the elution process of said preparation, and converts the result to an elution concentration.