The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 01, 2008

Filed:

May. 31, 2006
Applicants:

Jeffrey M. Dicarlo, Menlo Park, CA (US);

Casey L. Miller, Ft. Collins, CO (US);

Inventors:

Jeffrey M. DiCarlo, Menlo Park, CA (US);

Casey L. Miller, Ft. Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
Abstract

Ambient light analysis methods, imaging devices, and articles of manufacture are described. According to one aspect, an ambient light analysis method includes emitting light using a source, first filtering the light of the source providing first filtered light, first receiving the first filtered light using an imaging device, providing a first response of the imaging device to the first filtered light, second filtering ambient light providing second filtered light, second receiving the second filtered light using the imaging device, providing a second response of the imaging device to the second filtered light, and determining information regarding a spectral power distribution of the ambient light using the first response and the second response.


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