The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Dec. 20, 2005
Matthew Lekson, Woodinville, WA (US);
David R. Jenkins, Redmond, WA (US);
Matthew Lekson, Woodinville, WA (US);
David R. Jenkins, Redmond, WA (US);
Radiant Imaging, Inc., Duvall, WA (US);
Abstract
Systems and methods for applying different color calibrations at different locations in an imaging photometer measurement are disclosed herein. In one embodiment, a method for measuring a light source having a first area with a first spectral distribution and a second area having a second spectral power distribution can include selecting one or more data points in the first area for measurement. The method then includes applying a calibration to the selected data points in the first area such that a desired colorimetric result is displayed for each data point in a single colorimetric measurement of the first area. In several embodiments, the method can further include selecting one or more data points in the second area, and applying a different calibration to the selected portions of the second area such that a desired colorimetric result is also displayed for each data point in the second area.