The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Feb. 06, 2007
Yong Han Frankie Low, Lengkong Tiga, SG;
Kwang YE Sim, Jalan Membina, SG;
Eu Gene Glen Foo, Edgedale Plains, SG;
Yong Han Frankie Low, Lengkong Tiga, SG;
Kwang Ye Sim, Jalan Membina, SG;
Eu Gene Glen Foo, Edgedale Plains, SG;
Systems on Silicon Manufacturing Co. Pte. Ltd., Singapore, SG;
Abstract
A method of determining the time to failure of parallel electro migration test structures is described. The method generally includes the steps of: measuring the resistance of the complete structure; calculating the resistance of the n individual parallel structures from the measured resistance; calculating the resistance of the complete structure after the failure of m individual parallel structures, for m=1 to n; and recording the time of failure for each m as the time when the resistance is approximately the value predicted for m fails.