The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Oct. 22, 2004
William R. Schley, Rancho Santa Margarita, CA (US);
Eric B. Chapman, Brea, CA (US);
Dan Thanh Nguyen, Irvine, CA (US);
Lawrence P. Flesch, Westminster, CA (US);
Sandra Lynn Harper, Dana Point, CA (US);
Curtis Edgar Stevens, Irvine, CA (US);
William R. Schley, Rancho Santa Margarita, CA (US);
Eric B. Chapman, Brea, CA (US);
Dan Thanh Nguyen, Irvine, CA (US);
Lawrence P. Flesch, Westminster, CA (US);
Sandra Lynn Harper, Dana Point, CA (US);
Curtis Edgar Stevens, Irvine, CA (US);
Parker-Hannifan Corporation, Cleveland, OH (US);
Abstract
A system and method for measuring the position of at least one field producing element (e.g., a magnet) without a direct electrical or physical connection between the field producing element and one or more sensors. In one embodiment, the output from an array of sensors (e.g., Hall Effect sensors) is curve fit using an algorithm having a characteristic bell curve (e.g., curve fit tracking algorithm, center of gravity algorithm, etc.) to determine at least one of an absolute or relative position associated with the field producing element and/or a property associated with the field producing element (e.g., magnetic flux). Another embodiment is directed to detecting errors in one or more of the sensors and excluding the output of the faulty sensors in determining the position associated with the field producing element.