The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Mar. 28, 2006
Ronald L. Grimm, Ii, Costa Mesa, CA (US);
Jesse L. Beauchamp, LaCanada Flintridge, CA (US);
Ronald L. Grimm, II, Costa Mesa, CA (US);
Jesse L. Beauchamp, LaCanada Flintridge, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
A method and apparatus for probing the chemistry of a single droplet are provided. The technique uses a variation of the field-induced droplet ionization (FIDI) method, in which isolated droplets undergo heterogeneous reactions between solution phase analytes and gas-phase species. Following a specified reaction time, the application of a high electric field induces FIDI in the droplet, generating fine jets of highly charged progeny droplets that can then be characterized. Sampling over a range of delay times following exposure of the droplet to gas phase reactants, the spectra yield the temporal variation of reactant and product concentrations. Following the initial mass spectrometry studies, we developed an experiment to explore the parameter space associated with FIDI in an attempt to better understand and control the technique. In an alternative embodiment of the invention switched electric fields are integrated with the technique to allow for time-resolved studies of the droplet distortion, jetting, and charged progeny droplet formation associated with FIDI.