The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7394062 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 01, 2008

Filed:

Nov. 18, 2005
Applicant:

Hiroshi Watanabe, Utsunomiya, JP;

Inventor:

Hiroshi Watanabe, Utsunomiya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

When a convex lenscomes close to 0-th order transmitted light Twith rotation of an optical scale, the 0-th order transmitted light Tderived from a light beam L emitted from a light sourceand transmitted through a diffraction gratingaround is converged and incident on a reference position signal detection sensor. At that time, a large output is obtained from the reference position signal detection sensor. This signal constitutes a reference position signal. On the other hand, reflective diffracted light beams La, Lb having been reflected by the diffraction grating are detected by a diffraction light detection sensorafter interference, so that the speed and the angle etc. of the scaleare detected. In this way, the reference position signal and an incremental signal are detected at the same position on the optical scale.


Find Patent Forward Citations

Watanabe, Hiroshi. (2008). Displacement-measuring optical scale and optical encoder using same (U.S. Patent No. 7394062). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7394062

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