The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2008
Filed:
Sep. 29, 2005
Takuya Hara, Hamamatsu, JP;
Yoshikatsu Suzumura, Hamamatsu, JP;
Takuya Hara, Hamamatsu, JP;
Yoshikatsu Suzumura, Hamamatsu, JP;
Kowa Company, Ltd., , JP;
Abstract
When a Landolt ring optotype is presented in a visual acuity testing unit, an examinee answers a position of a slit of the optotype through an operation of a joystick lever or the like. If an examinee gives a right answer within a standard time at a first presentation of optotype, examination at a higher visual acuity grade is executed by presenting a smaller Landolt ring optotype. In case of a right answer over the standard time, reexamination at the same visual acuity grade is executed twice at the most. If a right answer is given at least once, examination at a higher visual acuity grade is executed. In case of a wrong answer within the standard time at a first presentation of optotype, reexamination at the same visual acuity is executed only once. If the right answer is given at this reexamination, examination at a higher visual acuity grade is executed. Reexamination is thus executed, so that the result of the examination is correct. In addition, the examination time can be shortened since necessary number of times of reexaminations is minimum.