The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7392169 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 24, 2008

Filed:

Oct. 21, 2004
Applicants:

Carol Ivash Gabele, Austin, TX (US);

Wolfgang Roesner, Austin, TX (US);

Derek Edward Williams, Austin, TX (US);

Inventors:

Carol Ivash Gabele, Austin, TX (US);

Wolfgang Roesner, Austin, TX (US);

Derek Edward Williams, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one method of simulation processing, instrumentation code, such as an runtime executive (rtx), receives one or more statements describing an count event and identifying the count event as an outlying count event. While simulating a design utilizing the HDL simulation model, occurrences of the outlying count event are counted to obtain a count event value. Simulation result data obtained from simulating the design is then received and processed. In the processing, the count event value is recorded within a data storage subsystem responsive to a determination of whether or not the count event value of the outlying count event exceeds a previously recorded count event value.


Find Patent Forward Citations

Gabele, Carol. (2008). Method, system and program product for defining and recording minimum and maximum event counts of a simulation utilizing a high level language (U.S. Patent No. 7392169). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7392169

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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