The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Jun. 06, 2005
Hans-peter Loock, Kingston, CA;
R. Stephen Brown, Kingston, CA;
John A. Barnes, Kingston, CA;
Nicholas R. Trefiak, Kingston, CA;
Krista L. Laugesen, Kingston, CA;
Galina Nemova, Montreal, CA;
Hans-Peter Loock, Kingston, CA;
R. Stephen Brown, Kingston, CA;
John A. Barnes, Kingston, CA;
Nicholas R. Trefiak, Kingston, CA;
Krista L. Laugesen, Kingston, CA;
Galina Nemova, Montreal, CA;
Queen's University at Kingston, Kingston, CA;
Abstract
The invention relates to optical sensors and systems and methods employing the sensors for detecting one or more compounds of interest in a test medium. In one embodiment an optical sensor comprising a long period grating and a solid phase microextraction (SPME) film is exposed to a test medium such that one or more compounds of interest are selectively partitioned into the solid phase microextraction film. At least one optical property of the sensor exposed to the test medium is compared with at least one corresponding optical property of the sensor in absence of the test medium; wherein a difference in the optical property is indicative of one or more compounds of interest in the test medium. The methods and systems may employ long period grating sensors with or without SPME films, and fiber loop ring-down spectroscopy to measure optical properties of the sensor.