The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Dec. 04, 2003
Hai-wen Chen, Orlando, FL (US);
Felix M. Fontan, Orlando, FL (US);
Teresa L. Olson, Winter Garden, FL (US);
Hai-Wen Chen, Orlando, FL (US);
Felix M. Fontan, Orlando, FL (US);
Teresa L. Olson, Winter Garden, FL (US);
Lockheed Martin Missiles & Fire Control, Orlando, FL (US);
Abstract
A system and method for estimating noise using measurement based parametric fitting non-uniformity correction is disclosed. Fixed pattern noise ('FPN') is estimating from an overall noise component within a detection system to enhance candidate target detection and tracking. A sensor in the detection system receives energy, such as radiant flux, that is converted to a digital image. A non-uniformity correction device generates an estimated FPN according to an applicable temperate range and integration time. A memory storing an array of coefficients is accessed to determine the estimated FPN. The valves within the array of coefficients are based on actual FPN measurements that are parametrically fitted.