The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Mar. 31, 2005
Mark Rahmes, Melbourne, FL (US);
Robert M. Garceau, Rockledge, FL (US);
Anthony O'neil Smith, Melbourne, FL (US);
John Karp, Indialantic, FL (US);
Todd Ham, Alexandria, VA (US);
David Elsner, Melbourne, FL (US);
Harlan Yates, Melbourne, FL (US);
Mark Rahmes, Melbourne, FL (US);
Robert M. Garceau, Rockledge, FL (US);
Anthony O'Neil Smith, Melbourne, FL (US);
John Karp, Indialantic, FL (US);
Todd Ham, Alexandria, VA (US);
David Elsner, Melbourne, FL (US);
Harlan Yates, Melbourne, FL (US);
Harris Corporation, Melbourne, FL (US);
Abstract
A method () comprises steps of: receiving a first digital model () of a first three-dimensional scene comprising at least one object; receiving a second digital model () of a second three-dimensional scene comprising at least one object; and performing a change analysis () on the first and second digital models to provide a difference indication representing a difference between the first and second models. In one embodiment a mean square error operation () is performed on the first and second digital models to provide a value indicating the difference between the digital models. In another embodiment, a conflation operation is performed on the difference model provided by the change analysis () and an object level change database () is produced.