The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Oct. 15, 2003
Hyun-woo Kim, Kyungki-do, KR;
Toshio Kamei, Kanagawa, JP;
Tae-kyun Kim, Kyungki-do, KR;
Won-jun Hwang, Seoul, KR;
Seok-cheol Kee, Kyungki-do, KR;
Hyun-woo Kim, Kyungki-do, KR;
Toshio Kamei, Kanagawa, JP;
Tae-kyun Kim, Kyungki-do, KR;
Won-jun Hwang, Seoul, KR;
Seok-cheol Kee, Kyungki-do, KR;
Samsung Electronics Co., Ltd., Suwon, Kyungki-Do, KR;
NEC Corporation, Minato-Ku, Tokyo, JP;
Abstract
A method and apparatus for extracting feature vectors for face recognition and retrieval are provided. An entire Fourier feature vector is generated for an entire face area of a normalized face image using first and second normalized vectors, and a central Fourier feature vector is generated for a central face area of the normalized face image using third and fourth normalized vectors. An entire intensity feature vector is generated for the entire face area, and a local intensity feature vector is generated for a predetermined number of face component-wise areas. An entire composite feature vector is generated by coupling the first and second normalized vectors and the entire intensity feature, and a central composite feature vector is generated by coupling the third and fourth normalized vectors and the local intensity feature vectors.