The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Jan. 14, 2005
Applicants:

Xiaoye Wu, Rexford, NY (US);

Piero Ugo Simoni, Greenfield, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Neil Barry Bromberg, Milwaukee, WI (US);

Inventors:

Xiaoye Wu, Rexford, NY (US);

Piero Ugo Simoni, Greenfield, WI (US);

Thomas Louis Toth, Brookfield, WI (US);

Neil Barry Bromberg, Milwaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a correction for beam hardening in CT images includes obtaining air scans at a plurality of kVp's, determining detection efficiencies for detector elements of the CT imaging apparatus, and estimating projection values through a combination of at least two different materials of different thicknesses. The method further includes determining a transfer function that translates the estimated projection values into ideal projection values for at least two of the different materials and storing the transfer function as the beam hardening correction for images of the CT imaging apparatus.


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