The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Aug. 24, 2004
Applicants:

Haruhisa Maruyama, Kofu, JP;

Matthew F. Niemeyer, North Chatham, NY (US);

David P. Reis, Lenox, MA (US);

Inventors:

Haruhisa Maruyama, Kofu, JP;

Matthew F. Niemeyer, North Chatham, NY (US);

David P. Reis, Lenox, MA (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a disc has a substrate; a data layer on the substrate; an anomaly-feature in the data layer disc capable of generating a read anomaly having a predictable anomaly profile; and anomaly profile data recorded in the data layer for characterizing the anomaly-feature. A disc can be labeled by imposing an anomaly-feature in the data layer capable of generating a read anomaly having a predictable anomaly profile; and disposing anomaly profile data on the disc, wherein the anomaly profile data characterizes the anomaly-feature.


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