The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Dec. 22, 2004
Applicants:

Julie E Fouquet, Portola Valley, CA (US);

Ian Hardcastle, Sunnyvale, CA (US);

Rene P Helbing, Palo Alto, CA (US);

Annette C. Grot, Cupertino, CA (US);

John Francis Petrilla, Palo Alto, CA (US);

Inventors:

Julie E Fouquet, Portola Valley, CA (US);

Ian Hardcastle, Sunnyvale, CA (US);

Rene P Helbing, Palo Alto, CA (US);

Annette C. Grot, Cupertino, CA (US);

John Francis Petrilla, Palo Alto, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01J 1/58 (2006.01); G01J 3/443 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.


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