The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Oct. 28, 2002
Applicant:

Stephen M. Schultz, Spanish Fork, UT (US);

Inventor:

Stephen M. Schultz, Spanish Fork, UT (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for producing spectrally segmented images of object fields. In one embodiment the system includes an optical system that focuses light received from an object field along a focal plane with a field stop positioned within the optical system that has plural apertures for selectively transmitting the light from the object field. A diffractive element is positioned within the optical system to spectrally spread, along the focal plane, the light transmitted through the apertures. The apertures can be parallel slots or geometrically arranges holes. The plural apertures are spaced such that the spectrally spread light transmitted through any given aperture and incident upon the focal plane does not overlap on the focal plane with the light transmitted through any other aperture. The diffractive element may spread light across one or more directions. In one embodiment, a processor is coupled to a plurality of pixels in a focal plane array. A memory for storing image data organized as a hyper-spectral cube.


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