The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Sep. 29, 2006
Applicant:
Ryuichi Tohma, Akashi, JP;
Inventor:
Ryuichi Tohma, Akashi, JP;
Assignee:
Sysmex Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/40 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope which comprises: an optical system for magnifying a sample; a focus adjuster for adjusting a focus of the optical system on the sample; an optical detector for detecting light through the optical system; a position estimator for estimating a position of the focus of the optical system, which stays with respect to the sample, based on the light detected by the optical detector while the optical system is vibrating with respect to the sample; and a controller for controlling the focus adjuster based on the position of the focus estimated by the position estimator, is disclosed. An auto focusing method for a microscope is also disclosed.