The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Oct. 15, 2001
Kristina Marie Burow, Cardiff, CA (US);
Jeremy S. Caldwell, Del Mar, CA (US);
Robert Charles Downs, La Jolla, CA (US);
Scott Allan Lesley, San Diego, CA (US);
James Kevin Mainquist, San Diego, CA (US);
Andrew J. Meyer, San Diego, CA (US);
Daniel G. Sipes, Bethel Island, CA (US);
Mark Richard Weselak, San Diego, CA (US);
Kristina Marie Burow, Cardiff, CA (US);
Jeremy S. Caldwell, Del Mar, CA (US);
Robert Charles Downs, La Jolla, CA (US);
Scott Allan Lesley, San Diego, CA (US);
James Kevin Mainquist, San Diego, CA (US);
Andrew J. Meyer, San Diego, CA (US);
Daniel G. Sipes, Bethel Island, CA (US);
Mark Richard Weselak, San Diego, CA (US);
IRM LLC, Hamilton, BM;
Abstract
Briefly, the present invention provides a system and method for high throughput processing using sample holders. The system has a plurality of work perimeters, with a rotational robot preferably associated with each work perimeter. At least one transfer station area is provided between adjacent work perimeters to facilitate robotic transfer of sample holders from one work perimeter to another area. Each work perimeter typically includes a plurality of defined station locations, with each station location positioned to be accessible by the robot associated with that area. In addition, each station location is typically configured to receive a device, such as an automated instrument or a holding nest. Device components are arranged at selected station locations according to specific application requirements to provide a flexible, robust, reliable, and accurate high throughput processing system.