The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2008

Filed:

Sep. 29, 2005
Applicants:

Qiang Wei, Novi, MI (US);

Ichiro Asano, Konan, JP;

Inventors:

Qiang Wei, Novi, MI (US);

Ichiro Asano, Konan, JP;

Assignee:

Horiba Instruments, Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A partial flow sampling system includes a system inlet for receiving an exhaust sample flow from a sample inlet probe and transfer line. The system further includes a dilution air control system for controlling a dilution air flow rate, and a mixer. The mixer receives and mixes the exhaust sample flow and the dilution air flow to produce a mixture flow. A total flow control system controls the mixture flow rate. An orifice flow meter installed at the system inlet measures the exhaust sample flow rate in. real-time. This provides accurate sample flow measurements over a wide range of dilution ratios and sample ratios.


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