The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 24, 2008
Filed:
Oct. 05, 2004
Tatsuo Uchida, Sendai, JP;
Tetsuya Miyashita, Sendai, JP;
Takahiro Ishinabe, Sendai, JP;
Tohoku Techno-Brains Corporation, Miyagi, JP;
Aomori Support Center for Industrial Promotion, Aomori, JP;
Abstract
In a measuring method for determining values of viscosity coefficients of a liquid crystal by fitting Ericksen-Leslie theoretical values to measured response characteristics, in the first step, ON response characteristics of a liquid crystal cellwith homogeneous alignment are initially measured, and a value of a rotational viscosity coefficient γis determined from the measured ON response characteristics. Then, in the second step, OFF response characteristics are measured, and values of Miesovicz shear viscosity coefficients ηand ηare determined from the measured OFF response characteristics. In the calculation in the first step, the viscosity coefficients other than γare assigned general values. In the calculation in the second step, γis assigned the value determined in the first step.