The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Dec. 03, 2001
Applicants:

Michael Fleischer-reumann, Wildberg, DE;

Peter Schinzel, Gaertringen, DE;

Guenther Tietz, Leinfelden-Echterdingen, DE;

Inventors:

Michael Fleischer-Reumann, Wildberg, DE;

Peter Schinzel, Gaertringen, DE;

Guenther Tietz, Leinfelden-Echterdingen, DE;

Assignee:

Agilent Technologies Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing a digital circuit as a Device under Test—DUT, including determining a Bit Error Rate—BER—value for each one of a determined number of sample points, the BER value representing the ratio of erroneous digital signals to the total number of regarded digital signals, executing a test for each one of the number of sample points by determining whether the determined BER value exceeds a threshold BER value for that sample point, and analyzing the results of executing the test for each one of the number of sample points for providing a statement about the condition of the DUT.


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