The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Jul. 21, 2003
Applicant:

Atsushi Yusa, Tokyo, JP;

Inventor:

Atsushi Yusa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a circuit for detecting an abnormal operation of memory, an integrated circuit including the same and a method for detecting an abnormal operation, an abnormal operation of memory is detected before an error occurs in the integrated circuit of a micro-computer and the like due to data wrongly output from the memory, enhancing the reliability of the integrated circuit. More specifically, a circuit is provided for detecting an abnormal operation of memory and includes a delay circuit for delaying an output data of memory for a predetermined period of time and for outputting this data as a delay data; and a comparison circuit for outputting a noncoincidence signal in a case that the output data of the memory and the delay data as compared are not coincident with each other.


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