The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Apr. 16, 2004
Mark A. Brodie, Briarcliff, NY (US);
Genady Grabarnik, Scarsdale, NY (US);
Sheng MA, Briarcliff Manor, NY (US);
Natalia V. Odintsova, Elmsford, NY (US);
Irina Rish, White Plains, NY (US);
Mark A. Brodie, Briarcliff, NY (US);
Genady Grabarnik, Scarsdale, NY (US);
Sheng Ma, Briarcliff Manor, NY (US);
Natalia V. Odintsova, Elmsford, NY (US);
Irina Rish, White Plains, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Improved problem diagnosis techniques for use in accordance with computing systems, e.g., distributed computing systems, are disclosed. In one aspect of the invention, a technique for diagnosing a problem associated with a computing system comprises the following steps/operations. One or more probes are executed in accordance with at least a portion of a previously selected probe schedule. When a result of one or more of the probes of the previously selected probe schedule indicates, at least, a potential problem associated with the computing system, one or more probes which optimize at least one criterion are selected in real-time. The one or more selected probes are executed so as to diagnose the potential problem.