The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Dec. 07, 2004
Applicant:
David William Adler, Mount Tremper, NY (US);
Inventor:
David William Adler, Mount Tremper, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system, method, and associated computer product improve the search of multidimensional databases. The present system determines a near-optimal grid index that is used to locate a geometric shape in a spatial database. More particularly, the present system improves the technique of sampling data for defining the grid cell size in a grid for a given data set, minimizing the number times the data set needs to be sampled, thereby reducing the time to compute the cost of alternative grid index parameters.