The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Sep. 22, 2003
Christian Simon, Laval, CA;
Jean-simon Lapointe, Montréal, CA;
Stéphane Baldo, Montréal, CA;
Matrox Electronics Systems, Ltd., Dorval, Quebec, CA;
Abstract
A method for determining a similarity score of a target object with respect to a model object. The target object is in a plane and the model object is represented by a model feature vector. The method comprises generating regions of the plane according to a first mass distribution of the target object and a second mass distribution of a part of the target object. Each of the generated regions has a corresponding mass distribution indicator. The method further comprises calculating a target feature vector for the target object according to at least one of the corresponding mass distribution indicators. Finally, the method computes the similarity score using the target feature vector and the model feature vector.