The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Aug. 18, 2004
Applicants:

Anton Deykoon, Malden, MA (US);

Zhengrong Ying, Wakefield, MA (US);

Carl R. Crawford, Brookline, MA (US);

Inventors:

Anton Deykoon, Malden, MA (US);

Zhengrong Ying, Wakefield, MA (US);

Carl R. Crawford, Brookline, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H05G 1/60 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of and a system for detecting anomalies in projection images generated by CT scanners are provided. One type of anomaly of particular interest is bright or/and dark dots in projection images, which correspond to streak artifacts in the CT images. The method for detecting such bright or/and dark dots in projection images comprises: generating projection images; computing a CFAR distance map; computing a preliminary dot map; generating dot histograms; and detecting bright dots or/and dark dots based on the generated histograms.


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