The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Sep. 23, 2004
Applicants:

Shu-schung Lee, Houston, TX (US);

John Willis, Houston, TX (US);

Yeashung Lin, Sugar Land, TX (US);

Inventors:

Shu-Schung Lee, Houston, TX (US);

John Willis, Houston, TX (US);

Yeashung Lin, Sugar Land, TX (US);

Assignee:

PGS Americas, Inc., Houston, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is disclosed for depth migrating seismic data. The method includes pre-stack time migrating the seismic data to form a stacked, time migrated image. The stacked, time migrated image is demigrated, and post-stack depth migration is then performed on the demigrated image. In some embodiments, the pre-stack time migration and the demigration account for ray bending in vertically transversely isotropic media.


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