The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Apr. 15, 2005
Suk-won Lee, Suwon-si, KR;
Kwang-soo Kim, Suwon-si, KR;
Dae-gab Gweon, Daejeon, KR;
Dong-kyun Kang, Daejeon, KR;
Hong-ki Yoo, Bucheon, KR;
Seung-woo Lee, Daejeon, KR;
Suk-Won Lee, Suwon-si, KR;
Kwang-Soo Kim, Suwon-si, KR;
Dae-Gab Gweon, Daejeon, KR;
Dong-Kyun Kang, Daejeon, KR;
Hong-Ki Yoo, Bucheon, KR;
Seung-Woo Lee, Daejeon, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A confocal scanning microscope using a Nipkow disk prevents deterioration of performance in an optical axis direction while maintaining a high measurement speed. The confocal scanning microscope includes a light source, an illuminating device to pass the light from the light source toward a certain direction, and two Nipkow disks each having slit-shaped apertures formed thereon such that the light incident from the illuminating device travels in a form of light which passed through a single aperture. In addition, the confocal scanning microscope includes a first optical system to form an image on a sample by the light passed through the Nipkow disks, and a second optical system to form a second image by the light reflected from the sample and passed through the Nipkow disks.