The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Nov. 02, 2005
Yan Zhou, Pleasanton, CA (US);
Matthew J. Everett, Livermore, CA (US);
Martin Hacker, Pleasanton, CA (US);
Yan Zhou, Pleasanton, CA (US);
Matthew J. Everett, Livermore, CA (US);
Martin Hacker, Pleasanton, CA (US);
Carl Ziess Meditec, Inc., Dublin, CA (US);
Abstract
An interferometer configured for use in optical coherence domain (OCT) reflectometry systems is disclosed. In the preferred embodiments, efficient routing of light and a balanced detection arrangement provide a high signal to noise ratio. In a first set of embodiments, a 3×3 coupler is used to split light along separate sample and reference paths and also for combining light returning from those paths and supplying the interfered collected light to the detection system. In an alternate set of embodiments, a pair of cascaded 2×2 couplers provides a similar function. The interferometer can be used with various OCT modalities including time-domain and frequency domain approaches.