The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Sep. 30, 2005
Applicants:
Thomas Happ, Tarrytown, NY (US);
Shoaib Hasan Zaidi, Poughkeepsie, NY (US);
Inventors:
Thomas Happ, Tarrytown, NY (US);
Shoaib Hasan Zaidi, Poughkeepsie, NY (US);
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system includes a non-contacting optical measurement instrument and a controller. The non-contacting optical measurement instrument is configured to obtain a measurement of a phase-change material. The controller is configured to determine a resistivity of the phase-change material based on the measurement.
Happ, Thomas. (2008). Optical determination of resistivity of phase change materials (U.S. Patent No. 7388667). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7388667
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile