The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Nov. 02, 2005
Applicants:

Oliver Heid, Gunzenhausen, DE;

Thomas Kluge, Hirschaid, DE;

Inventors:

Oliver Heid, Gunzenhausen, DE;

Thomas Kluge, Hirschaid, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an MRT method and apparatus with oversampling in at least one phase coding direction of a first region of interest to be visualized, an overview slice image is acquired across the entire subject to be examined in a selected slice, a marking input of the first image region of interest to be measured is detected in the overview slice image, and the first image region is expanded in at least one phase coding direction, dependent on the geometry of the first image region, the overview slice image, as well as the relative position of both image regions relative to one another, such that an expanded, oversampled second image region is obtained that completely contains the first image region and is foldover-free in this first image region.


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