The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 17, 2008
Filed:
Aug. 11, 2003
John W. Juvinall, Ottawa Lake, MI (US);
James A. Ringlien, Maumee, OH (US);
Timothy J. Nicks, Maumee, OH (US);
William H. Anderson, Sylvania, OH (US);
Brian A. Langenderfer, Sylvania, OH (US);
John W. Juvinall, Ottawa Lake, MI (US);
James A. Ringlien, Maumee, OH (US);
Timothy J. Nicks, Maumee, OH (US);
William H. Anderson, Sylvania, OH (US);
Brian A. Langenderfer, Sylvania, OH (US);
Owens-Brockway Glass Container Inc., Perrysburg, OH (US);
Abstract
A container inspection apparatus and method measures both warp and off-level of an annular sealing surface of a container. The apparatus preferably has a warp gauge device and an off-level gauge device suspended over a container support and base by at least one column for the warp gauge device and a pillar for the off-level gauge device. When measuring for warp, the off-level gauge device is constructed and arranged to pivot clear of the warp gauge device, and vice-versa when measuring for off-level. The container preferably is held laterally or radially in place by two V-bracket assemblies, and vertically in place by a container support. The V-bracket assemblies are adjustable vertically to accommodate containers of differing diameters and heights. A spring loaded roller assembly supported by the pillar biases the sidewall of the container against the V-bracket assemblies assuring multiple points of contact properly to orient the container for distortion measurements by both the warp and off-level gauge devices. The V-bracket assemblies preferably are associated with a scale for orienting the containers of differing diameter along a common centerline utilized by both the warp and off-level gauge devices.