The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2008

Filed:

Jul. 21, 2005
Applicants:

Jaime D. Choi, Somerville, MA (US);

Benjamin Paxton, Cambridge, MA (US);

Thomas Feurer, Bern, CH;

Masashi Yamaguchi, Green Island, NY (US);

Keith A. Nelson, Newton, MA (US);

Inventors:

Jaime D. Choi, Somerville, MA (US);

Benjamin Paxton, Cambridge, MA (US);

Thomas Feurer, Bern, CH;

Masashi Yamaguchi, Green Island, NY (US);

Keith A. Nelson, Newton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/00 (2006.01); G01F 2/02 (2006.01); G01B 11/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for characterizing one or more properties of a sample using acoustic waveforms is disclosed, and comprises directing a sequence of at least three optical pulses to the sample to generate an acoustic response in the sample at a frequency corresponding to the pulse sequence, varying the timing of one or more of the pulses in the sequence to vary the frequency of the acoustic response in the sample, and measuring the strength of the acoustic response as a function of the varied frequency to determine information about the sample.


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