The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Dec. 20, 2004
Applicants:

Michael J. Kozel, Upton, MA (US);

Jeffrey A. Moore, South Grafton, MA (US);

Brandon C. Barney, Hudson, MA (US);

Inventors:

Michael J. Kozel, Upton, MA (US);

Jeffrey A. Moore, South Grafton, MA (US);

Brandon C. Barney, Hudson, MA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test module is provided for testing system modules. All the test circuitry and test connectors reside on the test module. The test module is coupled to the system modules during testing, and is removed from the system after testing. Test connectors and test circuitry on the test module support such test functions as voltage margining, CPU emulation, and JTAG boundary scanning. A JTAG selection function can also be provided for selecting one or more JTAG loops for testing individually or as a single loop. The test module further includes level shifters for converting between 3.3V and 1.2V.


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