The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Jan. 21, 2005
Applicants:

Allon Adir, Kiryat Tivon, IL;

Eyal Bin, Haifa, IL;

Roy Emek, Tel Aviv-Jaffa, IL;

Kirill Shoikhet, Haifa, IL;

Inventors:

Allon Adir, Kiryat Tivon, IL;

Eyal Bin, Haifa, IL;

Roy Emek, Tel Aviv-Jaffa, IL;

Kirill Shoikhet, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for automatically generating test programs includes receiving a description of a system under test, expressed in terms of variables associated with the system and conditional constraints including semantics applied to the variables, and receiving a definition of an event to be tested in the system. The method generates an ECondCSP over the variables responsively to the definition of the event and to the conditional constraints, such that at least some of the semantics of the conditional constraints are preserved in the ECondCSP when one or more of the variables to which the semantics are applied are inactive. The ECondCSP is solved to generate a test case for the system.


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