The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Apr. 28, 2000
Applicants:

Christopher L. Black, Knoxville, TN (US);

J. Wesley Hines, Lenoir City, TN (US);

Inventors:

Christopher L. Black, Knoxville, TN (US);

J. Wesley Hines, Lenoir City, TN (US);

Assignee:

Smartsignal Corporation, Lisle, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An NSET method and apparatus for modeling and monitoring the status of a system is disclosed. The NSET employs a nonlinear similarity operator in place of linear matrix multiplication, to estimate a set of sensor data based on learned reference data, responsive to receiving a set of actual sensor data. Regularization is used in the generation of the estimate. The estimated data values and the actual sensor data are differenced to produce residuals, which are statistically tested with a SPRT to detect anomalies. Cluster centers may be used to represent learned reference data. The detection of anomalies can be used advantageously for sensor calibration verification.


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