The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Sep. 24, 2004
Bruno Kristiaan Bernard Deman, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
Bruno Kristiaan Bernard Deman, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for iteratively reconstructing image data acquired by a computed tomography system is provided. The method comprises generating a calculated sinogram from an image estimate and generating an error sinogram based on the calculated sinogram and a measured sinogram. Then, one or more backprojections are performed, each based upon a reconstruction parameter. The reconstruction parameter impacts at least one of convergence speed and computational cost of each iterative step and corresponding reconstruction. A filtering step is performed prior to performing the one or more backprojections. Finally, the initial image is updated by adding corresponding results of the one or more backprojections to the image estimate to obtain the reconstructed image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile