The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Dec. 18, 2003
Applicants:

Ruud Vlutters, Eindhoven, NL;

Wilhelmus Robert Koppers, Eindhoven, NL;

Pierre Hermanus Woerlee, Eindhoven, NL;

Mark Van Schijndel, Eindhoven, NL;

Inventors:

Ruud Vlutters, Eindhoven, NL;

Wilhelmus Robert Koppers, Eindhoven, NL;

Pierre Hermanus Woerlee, Eindhoven, NL;

Mark Van Schijndel, Eindhoven, NL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01); B32B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A rewritable optical record carrier comprising a first substrate carrying a first recording stack of layers, which recording stack comprises, a first dielectric layer, a recording layer comprising a phase-change recording material, a second dielectric layer, and a metal mirror layer. In order to achieve a maximum R*M said first dielectric layer has a thickness din the range of 20 nm to 50 nm, and said second dielectric layer has a thickness daccording to the relation 0.0225*d−2.6572*d+173.3 (nm)<d<0.0225*d−2.6572*d+213.3 (nm) when the mirror layer comprises aluminum, or a thickness daccording to the relationship 0.0191*d−2.0482*d+149.6 (nm)<d<0.0191*d−2.0482*d+189.6 (nm) when the mirror layer comprises silver.


Find Patent Forward Citations

Loading…