The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Jul. 23, 2003
Applicants:

Jong-hoon Lee, Gyeonggi-do, KR;

Gwang-ho Lee, Gyeonggi-do, KR;

Inventors:

Jong-hoon Lee, Gyeonggi-do, KR;

Gwang-ho Lee, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/783 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a method determine an area of an optical disc in which an inner area and an outer area of the optical disc having an absolute time of 99 minutes are distinguished from each other by referring to a number of ATIP syncs. The method includes counting the number of ATIP syncs for one rotation of the optical disc at a current position of a pickup when ATIP information recorded on the optical disc indicates that the pickup is currently present in an area of the optical disk that is greater than or equal to 95 minutes; and determining the current position of the pickup by comparing the number of counted ATIP syncs with a reference number of ATIP syncs. Accordingly, time spent determining the area of an optical disc and accessing the optical disc is reduced.


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