The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7385894 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 10, 2008

Filed:

May. 19, 2005
Applicants:

Yi-chuan Pan, Hsinchu, TW;

Jen-kuei Hsieh, Hsinchu, TW;

Inventors:

Yi-Chuan Pan, Hsinchu, TW;

Jen-Kuei Hsieh, Hsinchu, TW;

Assignee:

Lite-On it Corp., Taipei, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for determining defective blocks of an optical disc, a defect-detection procedure for each block of the optical disc is performed. After the defect-detection procedure, a preliminary defective group of the optical disc is realized. Subsequently, the track number between two selected defective blocks of the preliminary defective group are detected. When the track number is less than a predetermined number, the blocks lying in a linear region including the two selected blocks are defined as defective blocks in addition to all defective blocks included in the preliminary defective group.


Find Patent Forward Citations

Pan, Yi-Chuan. (2008). Method for determining defective blocks of optical disc (U.S. Patent No. 7385894). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7385894

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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