The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2008

Filed:

Mar. 06, 2006
Applicants:

Uri Ghera, Tel-Aviv, IL;

Alex Shlifer, Rehovot, IL;

Tomer Eliyahu, Rishon Lezion, IL;

David Menashe, Tel-Aviv, IL;

Inventors:

Uri Ghera, Tel-Aviv, IL;

Alex Shlifer, Rehovot, IL;

Tomer Eliyahu, Rishon Lezion, IL;

David Menashe, Tel-Aviv, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 4/00 (2006.01); H04B 10/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

Efficient wavelength calibration in a WDM optical amplifier that includes an optical channel monitor (OCM) is obtained by introducing a notch into the amplified spontaneous emission (ASE) noise spectrum of the amplifier outside a WDM transmission band, and having the OCM detect the notch and use the notch as a reference to calibrate the wavelength measurement. The notch is introduced into the ASE noise spectrum using a notch filter, which is preferably incorporated in a gain flattening filter (GFF).


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