The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Aug. 14, 2006
Yoshihiro Ishibe, Utsunomiya, JP;
Takahisa Kato, Atsugi, JP;
Susumu Yasuda, Tsukuba, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning system includes a deflecting device to scanningly deflect a light beam from a light source in a main scan direction, and an imaging optical system for imaging, upon a surface to be scanned, the light beam deflected by a deflecting surface of the deflecting device. First and second differences in wavefront aberration are respectively produced as a result of reflection by the deflecting surface and as a result of transmission through the imaging optical system. At least one optical surface inside the imaging optical system is non-arcuate in a main scan section, so as to assure that the first and second phase differences are made opposite to each other.