The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Nov. 29, 2005
Dennis T. Sturgill, Perrysburg, OH (US);
Dennis T. Sturgill, Perrysburg, OH (US);
Other;
Abstract
A method is provided for measuring the wall thickness of transparent articles using uniform diverging light in the form of a small point source or elongated narrow line of light, measuring the spacial separation of the reflections from the nearest and furthest surface by means of a two-dimensional image sensor and a computational device to calculate the geometrical corrections needed to provide accurate thickness measurements. In situations where significant thickness variations occur, a symmetrical two view embodiment using two uniform diverging light sources and two image sensors at equal but opposite angles of incidence from the same side of the object, provides a means to correct for errors caused by internal prism effects as a result of undulations of either the nearest or furthest surface. This system provides accurate thickness measurements over a wide range of object movement.