The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 10, 2008
Filed:
Jul. 22, 2004
Joseph P. Kolp, North Canton, OH (US);
Thomas J. Sebok, Tallmadge, OH (US);
Douglas E. Russell, Canal Fulton, OH (US);
Joseph P. Kolp, North Canton, OH (US);
Thomas J. Sebok, Tallmadge, OH (US);
Douglas E. Russell, Canal Fulton, OH (US);
Lockheed Martin Corporation, Akron, OH (US);
Abstract
A tribological debris analysis system alternately including a general purpose computer used in conjunction with an imaging device and an illumination delivery system, or a circuit board integrating an embedded processor with the imaging device used in conjunction with the illumination delivery system. The illumination delivery system includes a bypass conduit connected to the machine under evaluation, an optical flow cell, a pump for pumping a fluid through the optical flow cell connected to the bypass conduit, and a laser for illuminating the fluid flowing through the optical flow cell. The imaging device detects debris and sends information representative of the debris to the general purpose computer or the embedded processor. The general purpose computer or the embedded processor classifies the debris according to size, generates shape features of the imaged debris and identifies a type of object wear based upon the shape features.